標題: | The impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexer |
作者: | Lin, Chun-Ting Huang, Yang-Tung Huang, Jung-Yaw 電子工程學系及電子研究所 光電工程學系 Department of Electronics Engineering and Institute of Electronics Department of Photonics |
關鍵字: | planar waveguide;etched diffraction grating;flat-top;crosstalk;insertion loss;phase and amplitude errors;wavelength-division multiplexing (WDM) |
公開日期: | 1-十一月-2007 |
摘要: | The spectral performance of a demultiplexer is significantly affected by the phase and amplitude errors due to fabrication errors. We estimate the impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexer using a design example. Simulation results show that the photomask resolution resulting in a phase error should be lower than 40 nm when a crosstalk criterion of -30 dB is given. The impact of amplitude errors is not distinct until the reduced amount of the facet width is greater than 0.5 mu m and the grating side-wall angle offset from the vertical is larger than 1 degrees. |
URI: | http://dx.doi.org/10.1143/JJAP.46.7356 http://hdl.handle.net/11536/10203 |
ISSN: | 0021-4922 |
DOI: | 10.1143/JJAP.46.7356 |
期刊: | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS |
Volume: | 46 |
Issue: | 11 |
起始頁: | 7356 |
結束頁: | 7358 |
顯示於類別: | 期刊論文 |