標題: The impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexer
作者: Lin, Chun-Ting
Huang, Yang-Tung
Huang, Jung-Yaw
電子工程學系及電子研究所
光電工程學系
Department of Electronics Engineering and Institute of Electronics
Department of Photonics
關鍵字: planar waveguide;etched diffraction grating;flat-top;crosstalk;insertion loss;phase and amplitude errors;wavelength-division multiplexing (WDM)
公開日期: 1-Nov-2007
摘要: The spectral performance of a demultiplexer is significantly affected by the phase and amplitude errors due to fabrication errors. We estimate the impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexer using a design example. Simulation results show that the photomask resolution resulting in a phase error should be lower than 40 nm when a crosstalk criterion of -30 dB is given. The impact of amplitude errors is not distinct until the reduced amount of the facet width is greater than 0.5 mu m and the grating side-wall angle offset from the vertical is larger than 1 degrees.
URI: http://dx.doi.org/10.1143/JJAP.46.7356
http://hdl.handle.net/11536/10203
ISSN: 0021-4922
DOI: 10.1143/JJAP.46.7356
期刊: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
Volume: 46
Issue: 11
起始頁: 7356
結束頁: 7358
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