標題: High responsivity of GaN p-i-n photodiode by using low-temperature interlayer
作者: Lin, J. C.
Su, Y. K.
Chang, S. J.
Lan, W. H.
Huang, K. C.
Chen, W. R.
Huang, C. Y.
Lai, W. C.
Lin, W. J.
Cheng, Y. C.
電子物理學系
Department of Electrophysics
公開日期: 22-Oct-2007
摘要: Gallium nitride p-i-n ultraviolet photodiodes with low- temperature (LT)- GaN interlayer have been fabricated. It was found that the dark current of photodiode with LT- GaN interlayer is as small as 143 pA at 5 V reverse bias. It was also found that the responsivity of the photodiode with LT- GaN interlayer can be enhanced at a small electric field (similar to 0.4 MV/cm) due to the carrier multiplication effect. The UV photocurrent gain of 13 and large ionization coefficient (alpha = 3.1 X 10(5) cm(-1)) were also observed in the detector with LT- GaN interlayer. Furthermore, we can achieve a large peak responsivity of 2.27 A/W from the photodiode with LT- GaN interlayer. (C) 2007 American Institute of Physics.
URI: http://dx.doi.org/10.1063/1.2800813
http://hdl.handle.net/11536/10225
ISSN: 0003-6951
DOI: 10.1063/1.2800813
期刊: APPLIED PHYSICS LETTERS
Volume: 91
Issue: 17
結束頁: 
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