標題: 凸塊接點之電阻測量結構及包含其之封裝基板
作者: 陳智
張元蔚
公開日期: 1-Jun-2014
官方說明文件#: G01R027/08
URI: http://hdl.handle.net/11536/103564
專利國: TWN
專利號碼: I439704
Appears in Collections:Patents


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