完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen | en_US |
dc.contributor.author | Wei-Kuo | en_US |
dc.contributor.author | Lee | en_US |
dc.contributor.author | Ming-Chih | en_US |
dc.contributor.author | Chou | en_US |
dc.contributor.author | Wu-Ching | en_US |
dc.contributor.author | Chen | en_US |
dc.contributor.author | Wen-Hsiung | en_US |
dc.contributor.author | Ke | en_US |
dc.contributor.author | Wen-Cheng | en_US |
dc.date.accessioned | 2014-12-16T06:14:30Z | - |
dc.date.available | 2014-12-16T06:14:30Z | - |
dc.date.issued | 2007-11-13 | en_US |
dc.identifier.govdoc | C30B028/14 | zh_TW |
dc.identifier.govdoc | C30B023/00 | zh_TW |
dc.identifier.govdoc | C30B025/00 | zh_TW |
dc.identifier.govdoc | C30B028/12 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/104778 | - |
dc.description.abstract | Process for fabricating self-assembled nanoparticles on buffer layers without mask making and allowing for any degree of lattice mismatch; that is, binary, ternary or quaternary nanoparticles comprising Groups III-V, II-VI or IV-VI. The process includes a first step of applying a buffer layer, a second step of turning on the purge gas to modulate the first reactant to the lower first flow rate, then the second reactant is supplied to the buffer layer to form a metal-rich island on the buffer layer, and a third step of turning on purge gas again to modulate the first reactant to the higher second flow rate onto the buffer layer. On the metal-rich island is formed the nanoparticles of the binary, ternary or quaternary III-V, II-VI and IV-IV semiconductor material. This is then recrystallized under the first reactant flow at high temperature forming high quality nanoparticles. | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.title | Process for manufacturing self-assembled nanoparticles | zh_TW |
dc.type | Patents | en_US |
dc.citation.patentcountry | USA | zh_TW |
dc.citation.patentnumber | 07294202 | zh_TW |
顯示於類別: | 專利資料 |