| 標題: | Stacked Gate Structure, Metal-Oxide-Semiconductor Including the Same, and Method for Manufacturing the Stacked Gate Structure |
| 作者: | LIN Yueh-Chin CHANG Edward Yi CHUANG Ting-Wei |
| 公開日期: | 5-六月-2014 |
| 摘要: | The invention provides a stacked gate structure and metal-oxide-semiconductor including the same, and method for manufacturing the stacked gate structure. The stacked gate structure comprises a substrate, a semiconductor layer positioned on the substrate, a gate dielectric positioned on the semiconductor layer, and a gate electrode layer positioned on the gate dielectric, which the gate dielectric comprises a composite oxide layer composed of lanthanum oxide (La2O3) and hafnium oxide (HfO2). |
| 官方說明文件#: | H01L029/78 H01L021/28 |
| URI: | http://hdl.handle.net/11536/104912 |
| 專利國: | USA |
| 專利號碼: | 20140151710 |
| 顯示於類別: | 專利資料 |

