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dc.contributor.authorJiang, Tai-Yingen_US
dc.contributor.authorLiu, Chien-Nan Jimmyen_US
dc.contributor.authorJou, Jing-Yangen_US
dc.date.accessioned2014-12-08T15:13:35Z-
dc.date.available2014-12-08T15:13:35Z-
dc.date.issued2007-08-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2007.891366en_US
dc.identifier.urihttp://hdl.handle.net/11536/10492-
dc.description.abstractSimulation-based functional validation is still one of the primary approaches for verifying designs described in hardware description languages. Traditional code coverage metrics do not address the observability issue and may overestimate the extent of functional validation. Observability-based code coverage metric (OCCOM) is the first code coverage metric considering the essential observability issue. However, tags can only be observed or unobserved, providing only two levels of measurement (i.e., 1 and 0). Errors with lower opportunities to be observed may still be judged as observable, thus misleading the verification results. Therefore, instead of extending tag coverage, we develop a probabilistic observability measure and its efficient computation algorithm. Besides being used as a new OCCOM, our new measure can point out hard-to-observe points for inserting assertions to prevent bugs from hiding behind these points. Experimental results show that the detection of the injected errors and the degree of our observability measure are strongly related. The results also show that our fine-grained observability measure is less likely to overestimate the extent of validation. with reasonable computation time.en_US
dc.language.isoen_USen_US
dc.subjectcode coverage metricen_US
dc.subjecthardware description language (HDL)en_US
dc.subjectobservability analysisen_US
dc.titleObservability analysis on HDL descriptions for effective functional validationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCAD.2007.891366en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume26en_US
dc.citation.issue8en_US
dc.citation.spage1509en_US
dc.citation.epage1521en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000248235900013-
dc.citation.woscount2-
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