標題: A design-for-verification technique for functional pattern reduction
作者: Liu, CNJ
Chen, IL
Jou, JY
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-三月-2003
摘要: This technique reduces the number of required functional patterns by first defining conditions for hard-to-control (HTC) code in a hardware-description-language design and then using an algorithm to detect such code automatically. A second algorithm eliminates these HTC points by selecting a minimum number of nodes for control point insertion.
URI: http://dx.doi.org/10.1109/MDT.2003.1188262
http://hdl.handle.net/11536/28080
ISSN: 0740-7475
DOI: 10.1109/MDT.2003.1188262
期刊: IEEE DESIGN & TEST OF COMPUTERS
Volume: 20
Issue: 2
起始頁: 48
結束頁: 55
顯示於類別:期刊論文


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