標題: | A design-for-verification technique for functional pattern reduction |
作者: | Liu, CNJ Chen, IL Jou, JY 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-三月-2003 |
摘要: | This technique reduces the number of required functional patterns by first defining conditions for hard-to-control (HTC) code in a hardware-description-language design and then using an algorithm to detect such code automatically. A second algorithm eliminates these HTC points by selecting a minimum number of nodes for control point insertion. |
URI: | http://dx.doi.org/10.1109/MDT.2003.1188262 http://hdl.handle.net/11536/28080 |
ISSN: | 0740-7475 |
DOI: | 10.1109/MDT.2003.1188262 |
期刊: | IEEE DESIGN & TEST OF COMPUTERS |
Volume: | 20 |
Issue: | 2 |
起始頁: | 48 |
結束頁: | 55 |
顯示於類別: | 期刊論文 |