标题: | IEEE standard 1500 compatible oscillation ring test methodology for interconnect delay and crosstalk detection |
作者: | Li, Katherine Shu-Min Lee, Chung-Len Su, Chauchin Chen, Jwu E. 电子工程学系及电子研究所 Department of Electronics Engineering and Institute of Electronics |
关键字: | oscillation ring (OR) test scheme;interconnect test;SOC testing;stuck-at faults;open faults;delay faults;crosstalk glitches;IEEE P1500;wrapper cell design |
公开日期: | 1-八月-2007 |
摘要: | A novel oscillation ring (OR) test scheme and architecture for testing interconnects in SOC is proposed and demonstrated. In addition to stuck-at and open faults, this scheme can also detect delay faults and crosstalk glitches, which are otherwise very difficult to be tested under the traditional test schemes. IEEE Std. 1500 wrapper cells are modified to accommodate the test scheme. An efficient algorithm is proposed to construct ORs for SOC based on a graph model. Experimental results on MCNC benchmark circuits have been included to show the effectiveness of the algorithm. In all experiments, the scheme achieves 100% fault coverage with a small number of tests. |
URI: | http://dx.doi.org/10.1007/s10836-007-0759-5 http://hdl.handle.net/11536/10495 |
ISSN: | 0923-8174 |
DOI: | 10.1007/s10836-007-0759-5 |
期刊: | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS |
Volume: | 23 |
Issue: | 4 |
起始页: | 341 |
结束页: | 355 |
显示于类别: | Articles |
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