標題: | Oscillation ring based interconnect test scheme for SOC |
作者: | Li, Katherine Shu-Min Lee, Chung Len Su, Chauchin Chen, Jwu E. 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2005 |
摘要: | We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of the algorithm. Our method achieves 100% fault coverage with a small number of tests. |
URI: | http://hdl.handle.net/11536/17866 |
ISBN: | 0-7803-8736-8 |
期刊: | ASP-DAC 2005: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2 |
起始頁: | 184 |
結束頁: | 187 |
顯示於類別: | 會議論文 |