標題: Oscillation ring based interconnect test scheme for SOC
作者: Li, Katherine Shu-Min
Lee, Chung Len
Su, Chauchin
Chen, Jwu E.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2005
摘要: We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of the algorithm. Our method achieves 100% fault coverage with a small number of tests.
URI: http://hdl.handle.net/11536/17866
ISBN: 0-7803-8736-8
期刊: ASP-DAC 2005: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2
起始頁: 184
結束頁: 187
Appears in Collections:Conferences Paper