標題: SRAM based on 6 transistor structure including a first inverter, a second inverter, a first pass-gate transistor, and a second pass-gate transistor
作者: CHUANG Ching-Te
Jou Shyh-Jye
Hwang Wei
Lin Yi-Wei
Tsai Ming-Chien
Yang Hao-I
Tu Ming-Hsien
Shih Wei-Chiang
Lien Nan-Chun
Lee Kuen-Di
公開日期: 29-八月-2013
摘要: The present invention provides a 6T SRAM including a first inverter, a second inverter, a first pass-gate transistor, and a second pass-gate transistor. The first inverter zs a first pull-up transistor and a first pull-down transistor. The second inverter includes a second pull-up transistor and a second pull-down transistor. The gate of the second pull-up transistor is coupled with the gate of the second pull-down transistor, and the drain of the second pull-up transistor is coupled with the drain of the second pull-down transistor. The SRAM can measure the trip voltage, the read disturb voltage, and the write margin by controlling the first bit line, the second bit line, the GND, the first word line, and the voltage source without changing of the physic parameter of the SRAM.
官方說明文件#: G11C011/40
URI: http://hdl.handle.net/11536/105005
專利國: USA
專利號碼: 20130223136
顯示於類別:專利資料


文件中的檔案:

  1. 20130223136.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。