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dc.contributor.authorCHUANG Ching-Teen_US
dc.contributor.authorJou Shyh-Jyeen_US
dc.contributor.authorHwang Weien_US
dc.contributor.authorLin Yi-Weien_US
dc.contributor.authorTsai Ming-Chienen_US
dc.contributor.authorYang Hao-Ien_US
dc.contributor.authorTu Ming-Hsienen_US
dc.contributor.authorShih Wei-Chiangen_US
dc.contributor.authorLien Nan-Chunen_US
dc.contributor.authorLee Kuen-Dien_US
dc.date.accessioned2014-12-16T06:14:56Z-
dc.date.available2014-12-16T06:14:56Z-
dc.date.issued2013-08-29en_US
dc.identifier.govdocG11C011/40zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105005-
dc.description.abstractThe present invention provides a 6T SRAM including a first inverter, a second inverter, a first pass-gate transistor, and a second pass-gate transistor. The first inverter zs a first pull-up transistor and a first pull-down transistor. The second inverter includes a second pull-up transistor and a second pull-down transistor. The gate of the second pull-up transistor is coupled with the gate of the second pull-down transistor, and the drain of the second pull-up transistor is coupled with the drain of the second pull-down transistor. The SRAM can measure the trip voltage, the read disturb voltage, and the write margin by controlling the first bit line, the second bit line, the GND, the first word line, and the voltage source without changing of the physic parameter of the SRAM.zh_TW
dc.language.isozh_TWen_US
dc.titleSRAM based on 6 transistor structure including a first inverter, a second inverter, a first pass-gate transistor, and a second pass-gate transistorzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20130223136zh_TW
Appears in Collections:Patents


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