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dc.contributor.authorChuang Ching-Teen_US
dc.contributor.authorYang Hao-Ien_US
dc.contributor.authorLin Jihi-Yuen_US
dc.contributor.authorYang Shyh-Chyien_US
dc.contributor.authorTu Ming-Hsienen_US
dc.contributor.authorHwang Weien_US
dc.contributor.authorJou Shyh-Jyeen_US
dc.contributor.authorLee Kun-Tien_US
dc.contributor.authorLi Hung-Yuen_US
dc.date.accessioned2014-12-16T06:15:25Z-
dc.date.available2014-12-16T06:15:25Z-
dc.date.issued2011-06-02en_US
dc.identifier.govdocG11C007/10zh_TW
dc.identifier.govdocG11C007/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105302-
dc.description.abstractA disturb-free static random access memory cell includes: a latch circuit having a first access terminal and a second access terminal; a first switching circuit having a first bit transferring terminal coupled to the first access terminal, a first control terminal coupled to a first write word line, and a second bit transferring terminal; a second switching circuit having a third bit transferring terminal coupled to the second access terminal, a second control terminal coupled to a second write word line, and a fourth bit transferring terminal coupled to the second bit transferring terminal; a third switching circuit having a fifth bit transferring terminal coupled to the fourth bit transferring terminal, a third control terminal coupled to a word line, and a sixth bit transferring terminal coupled to a bit line; and a sensing amplifier coupled to the bit line, for determining a bit value appearing at the bit line.zh_TW
dc.language.isozh_TWen_US
dc.titleDISTURB-FREE STATIC RANDOM ACCESS MEMORY CELLzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20110128796zh_TW
Appears in Collections:Patents


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