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dc.contributor.authorSU, CHAU-CHINen_US
dc.contributor.authorLU, HUNG-WENen_US
dc.contributor.authorCHI, SHUN-MINen_US
dc.date.accessioned2014-12-16T06:15:56Z-
dc.date.available2014-12-16T06:15:56Z-
dc.date.issued2008-07-31en_US
dc.identifier.govdocH03M001/10zh_TW
dc.identifier.govdocH03M001/12zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105580-
dc.description.abstractA precisely self-calibrating high-speed analog to digital converter is disclosed, wherein the aspect ratios of tri-state inverters are adjusted to fine-tune threshold voltage as comparators. And the multiplexers composed of tri-state inverters amplify the signal from the output of comparators. Their switches of tri-state inverters may be properly controlled to select the optimal channels and reduce unnecessary power consumption. The calibration circuitry utilizes under-sampling to calculate the duty cycles of comparators, selecting the optimal comparators and channels. By the way, the invention may avoid process variation.zh_TW
dc.language.isozh_TWen_US
dc.titleSELF-CALIBRATING HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20080180289zh_TW
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