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dc.contributor.authorChen, Szu-Hungen_US
dc.contributor.authorKuo, Chien-Ien_US
dc.contributor.authorChang, Edward Yien_US
dc.date.accessioned2014-12-16T06:16:07Z-
dc.date.available2014-12-16T06:16:07Z-
dc.date.issued2007-03-22en_US
dc.identifier.govdocH01L021/4763zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105669-
dc.description.abstractA method for forming a gate pattern for an electronic device, comprising steps of: providing a substrate, whereon a first photo-resist layer is formed; performing a first photo-lithography process so as to form a first pattern with a first width on the substrate; forming a second photo-resist layer, covering the first pattern and the first photo-resist layer on the substrate; and performing a second photo-lithography process, which is shifted from the first photo-lithography process, so as to form a second pattern with a second width on the substrate; wherein the second width is smaller than the first width.zh_TW
dc.language.isozh_TWen_US
dc.titleMethod for forming gate pattern for electronic devicezh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20070066051zh_TW
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