標題: Process for protecting solder joints and structure for alleviating electromigration and joule heating in solder joints
作者: Chen, Chih
Yeh, Everett Chang-Ching
Tu, King-Ning
公開日期: 9-Feb-2006
摘要: This invention provides a process for protecting solder joints, comprising forming an UBM or pad metallurgy in solder joints and then further forming a small solder bump on UBM or pad metallurgy between substrate and chip. Wherein a material of high electric resistance is coated at the ends of UBM or pad metallurgy where substrate is connected to chip, as to equalize the current distribution of solder bump, therefore the electromigration resistance of solder joints is improved by suppressing the current crowding and joule heating phenomenon.
官方說明文件#: H01L023/48
URI: http://hdl.handle.net/11536/105714
專利國: USA
專利號碼: 20060027933
Appears in Collections:Patents


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