標題: | Process for protecting solder joints and structure for alleviating electromigration and joule heating in solder joints |
作者: | Chen, Chih Yeh, Everett Chang-Ching Tu, King-Ning |
公開日期: | 9-Feb-2006 |
摘要: | This invention provides a process for protecting solder joints, comprising forming an UBM or pad metallurgy in solder joints and then further forming a small solder bump on UBM or pad metallurgy between substrate and chip. Wherein a material of high electric resistance is coated at the ends of UBM or pad metallurgy where substrate is connected to chip, as to equalize the current distribution of solder bump, therefore the electromigration resistance of solder joints is improved by suppressing the current crowding and joule heating phenomenon. |
官方說明文件#: | H01L023/48 |
URI: | http://hdl.handle.net/11536/105714 |
專利國: | USA |
專利號碼: | 20060027933 |
Appears in Collections: | Patents |
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