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DC FieldValueLanguage
dc.contributor.author陸志豪en_US
dc.contributor.author廖▲彦▼欽en_US
dc.contributor.author李鎮宜en_US
dc.contributor.author張錫嘉en_US
dc.contributor.author許雅三en_US
dc.date.accessioned2014-12-16T06:16:23Z-
dc.date.available2014-12-16T06:16:23Z-
dc.date.issued2011-10-28en_US
dc.identifier.govdocH03M013/19zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105812-
dc.language.isozh_TWen_US
dc.title低密度パリティ検査（ＬＤＰＣ）デコーダに応用する演算回路zh_TW
dc.typePatentsen_US
dc.citation.patentcountryJPNzh_TW
dc.citation.patentnumber4852061zh_TW
Appears in Collections:Patents


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