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dc.contributor.authorYang, Tian-Renen_US
dc.contributor.authorTsai, Julius Ming-Linen_US
dc.contributor.authorHo, Chih-Longen_US
dc.contributor.authorHu, Roberten_US
dc.date.accessioned2014-12-08T15:13:41Z-
dc.date.available2014-12-08T15:13:41Z-
dc.date.issued2007-07-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2007.900214en_US
dc.identifier.urihttp://hdl.handle.net/11536/10593-
dc.description.abstractThis paper presents the derivation procedure used in determining the parameters in SiGe HBT's small-signal model where the Pi circuit configuration is employed. For both the transistor's external base-collector capacitor and its base spreading resistor, new close-form expressions have been derived. Comparisons with existing approaches vindicate the feasibility and effectiveness of our formulations. With the impact of the lossy substrate effectively modeled and the frequency dependency of the transconductance properly addressed, this proposed extraction approach demonstrates accurate results up to 30 GHz with different bias conditions.en_US
dc.language.isoen_USen_US
dc.subjectbase spreading resistoren_US
dc.subjectHBTen_US
dc.subjectPi modelen_US
dc.subjectSiGeen_US
dc.titleSiGe HBT's small-signal Pi modelingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMTT.2007.900214en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume55en_US
dc.citation.issue7en_US
dc.citation.spage1417en_US
dc.citation.epage1424en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000248063100001-
dc.citation.woscount5-
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