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dc.contributor.authorYin, Gung-Chianen_US
dc.contributor.authorChen, Fu-Rongen_US
dc.contributor.authorHwu, Yeukuangen_US
dc.contributor.authorShieh, Han-Ping D.en_US
dc.contributor.authorLiang, Keng S.en_US
dc.date.accessioned2014-12-08T15:14:12Z-
dc.date.available2014-12-08T15:14:12Z-
dc.date.issued2007-04-30en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2724066en_US
dc.identifier.urihttp://hdl.handle.net/11536/10882-
dc.description.abstractQuantitative phase retrieval with a sub-100-nm resolution is achieved from micrographs of a zone plate based transmission x-ray microscope. A plastic zone plate containing objects of sizes from micrometers down to tens of nanometers is used as a test sample to quantify the retrieved phase. Utilizing the focal serial images in the image plane, the phase information is retrieved quantitatively across the entire range of sizes by combining the transport intensity equation and self-consistent wave propagation methods in this partial coherence system. The study demonstrates a solution to overcome the deficiency encountered in the two phase retrieval approaches. (c) 2007 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleQuantitative phase retrieval in transmission hard x-ray microscopeen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2724066en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume90en_US
dc.citation.issue18en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000246210000018-
dc.citation.woscount5-
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