標題: | Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry |
作者: | Chao, Yu-Faye Han, Chien-Yuan 光電工程學系 Department of Photonics |
關鍵字: | ellipsometry;surface plasmon resonance;photoelastic modulator |
公開日期: | 20-Feb-2007 |
摘要: | A total internal reflection ellipsometer equipped with a photoelastic modulator (PEM) is installed to investigate the chemical activation and antibody immobilization process on thin gold films. We set up two detection channels in this configuration: one for real-time monitoring with a data rate of 1 set per second, and the other for post flight analysis with a data rate of 25,000 sets per second. More detailed information has been obtained through the post flight analysis technique during the chemical activation process. This surface plasmon resonance enhanced PEM ellipsometry provides higher sensitivity and temporal resolution. It is feasible to resolve a faster reaction such as chemical reaction or protein folding by the post flight analysis technique. (c) 2006 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.snb.2006.04.073 http://hdl.handle.net/11536/11115 |
ISSN: | 0925-4005 |
DOI: | 10.1016/j.snb.2006.04.073 |
期刊: | SENSORS AND ACTUATORS B-CHEMICAL |
Volume: | 121 |
Issue: | 2 |
起始頁: | 490 |
結束頁: | 495 |
Appears in Collections: | Articles |
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