標題: | An output buffer for 3.3-V applications in a 0.13-mu m 1/2.5-V CMOS process |
作者: | Chen, Shih-Lun Ker, Ming-Dou 電機學院 College of Electrical and Computer Engineering |
關鍵字: | gate-oxide reliability;level converter;mixed-voltage I/O;output buffer |
公開日期: | 1-一月-2007 |
摘要: | With a 3.3-V interface, such as PCI-X application, high-voltage overstress on the gate oxide is a serious reliability problem in designing I/O circuits by using only 1/2.5-V low-voltage devices in a 0.13-mu m CMOS process. Thus, a new output buffer realized with low-voltage (1- and 2.5-V) devices to drive high-voltage signals for 3.3-V applications is proposed in this paper. The proposed output buffer has been fabricated in a 0.13-mu m 1/2.5-V 1P8M CMOS process with Cu interconnects. The experimental results have confirmed that the proposed output buffer can be successfully operated at 133 MHz without suffering high-voltage gate-oxide overstress in the 3.3-V interface. In addition, a new level converter that is realized with only 1- and 2.5-V devices that can convert 0/1-V voltage swing to 1/3.3-V voltage swing is also presented in this paper. The experimental results have also confirmed that the proposed level converter can be operated correctly. |
URI: | http://dx.doi.org/10.1109/TCSII.2006.883202 http://hdl.handle.net/11536/11265 |
ISSN: | 1057-7130 |
DOI: | 10.1109/TCSII.2006.883202 |
期刊: | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS |
Volume: | 54 |
Issue: | 1 |
起始頁: | 14 |
結束頁: | 18 |
顯示於類別: | 期刊論文 |