Localized electrochemical oxidation of p-GaAs(100) using atomic force microscopy with a carbon nanotube probe

Abstract

The nanometre-scale oxidation characteristics of a p-GaAs(100) surface are investigated by atomic force microscope (AFM) electrochemical nanolithography with a multiwalled carbon nanotube (MWCNT) probe. The electrochemical parameters, such as anodizing voltages, scanning rate and modulated voltages, and how they affect the creation and growth of the oxide nanostructures are explored. The present results reveal that the initial growth rate (similar to 600 nm s(-1) for 10 V) decreases rapidly as the electric field strength is decreased. The oxide practically ceases to grow as the electric field is reduced to the order of similar to 1.2 x 10(7) V cm(-1). Also, the oxide growth rate depends not only on the electric field strength but also on the applied anodizing voltage. The present results show that the height of the oxide structures can be significantly improved at an applied anodizing voltage of 10 V by using a CNT probe. In addition, Auger electron spectroscopy (AES) measurements performed in the present work confirm that modified structures replace the form of anodizing p-GaAs(100).