標題: | Product-mix decision in a mixed-yield wafer fabrication scenario |
作者: | Wu, Muh-Cherng Chang, Wen-Jung Chiou, Chie-Wun 工業工程與管理學系 Department of Industrial Engineering and Management |
關鍵字: | mixed-yield scenario;product mix planning;scrapping |
公開日期: | 1-七月-2006 |
摘要: | The product mix decision problem for semiconductor manufacturing has been extensively studied in literature. However, most of them are based on a high-yield scenario. Yet, in a low-yield manufacturing environment, some research claims that scrap low-yield lots in an early stage may produce more profit. Considering the early scrapping characteristics, this paper aims to solve the product mix decision problem for a mixed-yield scenario, which involves the simultaneous production of high-yield and low-yield products. A nonlinear mathematical program is developed to model the decision problem. Two methods for solving the nonlinear program are proposed. Method 1 converts the nonlinear program into a linear program by setting some variables as parameters. The method provides an optimal solution by exhaustively searching these parameterized variables and solving the LP models iteratively. Method 2 aims to reduce the computation complexity while providing a near optimal solution. Experiment results show that method 2 is better than method 1, when aggregately considering solution quality and computation efforts. |
URI: | http://dx.doi.org/10.1007/s00170-005-2568-2 http://hdl.handle.net/11536/12112 |
ISSN: | 0268-3768 |
DOI: | 10.1007/s00170-005-2568-2 |
期刊: | INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY |
Volume: | 29 |
Issue: | 7-8 |
起始頁: | 746 |
結束頁: | 752 |
顯示於類別: | 期刊論文 |