標題: 晶圓廠高低良率混製下的產品組合決策
Product-Mix Decision in a Multiple Yield Wafer Fabrication Scenario
作者: 張文榮
Wen-Jung Chang
巫木誠
Muh-Cherng Wu
工業工程與管理學系
關鍵字: 產品組合;報廢準則;高低良率;小批量報廢;Product-mix;Small lot;Scrap rule;Yield
公開日期: 2003
摘要: 過去探討半導體產品組合的決策相當多。這些文獻大多隱含假設高良率的情境。而在低良率生產情境下,過去有些文獻提出提前報廢小批量可以提高產品利潤。本研究考慮提前報廢特性,分析高低良率情境下的產品組合決策問題,建立一非線性模型來分析此問題。如果將一些變數設成參數,此非線性模型可以轉變成線性規劃模型(Linear Programming, LP)。吾人可對這些變數做全數搜尋並重複解LP模型。另外,本研究也提出一方法可減少問題的複雜性與計算時間。
The product mix decision problem for semiconductor manufacturing has been extensively studied in literature. However, most of them are based on a high-yield scenario. Yet, in a low-yield manufacturing environment, some research claims that scrap low-yield lots in an early stage may produce more profit. Considering the early scrapping characteristics, this thesis aims to solve the product mix decision problem for a multiple-yield scenario. A nonlinear mathematical program has been formulated. This nonlinear program can be transformed into a linear programming model (LP model) if some variables are set parameters. We exhaustively search these parameterized variables and solve the LP models iteratively. A method for reducing the computation complexity of solving the decision problem has also been proposed.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT009133528
http://hdl.handle.net/11536/57501
顯示於類別:畢業論文