标题: 晶圆厂高低良率混制下的产品组合决策
Product-Mix Decision in a Multiple Yield Wafer Fabrication Scenario
作者: 张文荣
Wen-Jung Chang
巫木诚
Muh-Cherng Wu
工业工程与管理学系
关键字: 产品组合;报废准则;高低良率;小批量报废;Product-mix;Small lot;Scrap rule;Yield
公开日期: 2003
摘要: 过去探讨半导体产品组合的决策相当多。这些文献大多隐含假设高良率的情境。而在低良率生产情境下,过去有些文献提出提前报废小批量可以提高产品利润。本研究考虑提前报废特性,分析高低良率情境下的产品组合决策问题,建立一非线性模型来分析此问题。如果将一些变数设成参数,此非线性模型可以转变成线性规划模型(Linear Programming, LP)。吾人可对这些变数做全数搜寻并重复解LP模型。另外,本研究也提出一方法可减少问题的复杂性与计算时间。
The product mix decision problem for semiconductor manufacturing has been extensively studied in literature. However, most of them are based on a high-yield scenario. Yet, in a low-yield manufacturing environment, some research claims that scrap low-yield lots in an early stage may produce more profit. Considering the early scrapping characteristics, this thesis aims to solve the product mix decision problem for a multiple-yield scenario. A nonlinear mathematical program has been formulated. This nonlinear program can be transformed into a linear programming model (LP model) if some variables are set parameters. We exhaustively search these parameterized variables and solve the LP models iteratively. A method for reducing the computation complexity of solving the decision problem has also been proposed.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT009133528
http://hdl.handle.net/11536/57501
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