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dc.contributor.authorChen, PLen_US
dc.contributor.authorChung, CCen_US
dc.contributor.authorYang, JNen_US
dc.contributor.authorLee, CYen_US
dc.date.accessioned2014-12-08T15:16:29Z-
dc.date.available2014-12-08T15:16:29Z-
dc.date.issued2006-06-01en_US
dc.identifier.issn0018-9200en_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSSC.2006.874273en_US
dc.identifier.urihttp://hdl.handle.net/11536/12194-
dc.description.abstractThis work presents a clock generator with cascaded dynamic frequency counting (DFC) loops for wide multiplication range applications. The DFC loop, which uses variable time period to estimate and tune the frequency of the digitally controlled oscillator (DCO), enhances the resolution of frequency detection. The conventional phase-frequency detector (PFD) and programmable divider are replaced with a digital arithmetic comparator and a DCO timing counter. The value in the DCO timing counter is separated into quotient and remainder vectors. A threshold region is set in the remainder vector to reduce the influence of jitter variation in frequency detection. The loop stability can be retained by cascading two DFC loops when the multiplication factor (N) is large. The proposed clock generator achieves a multiplication range from 4 to 13 888 with output peak-to-peak jitter less than 2.8% of clock period. A test chip for the proposed clock generator is fabricated in 0.18-mu m CMOS process with core area of 0.16 mm(2). Power consumption is 15 mW.@ 378 MHz with 1.8-V supply voltage.en_US
dc.language.isoen_USen_US
dc.subjectclock generatoren_US
dc.subjectdigitally controlled oscillator (DCO)en_US
dc.subjectdigitally controlled varactor (DCV)en_US
dc.subjectdynamic frequency counting (DFC)en_US
dc.subjectphase-locked loop (PLL)en_US
dc.titleA clock generator with cascaded dynamic frequency counting loops for wide multiplication range applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/JSSC.2006.874273en_US
dc.identifier.journalIEEE JOURNAL OF SOLID-STATE CIRCUITSen_US
dc.citation.volume41en_US
dc.citation.issue6en_US
dc.citation.spage1275en_US
dc.citation.epage1285en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000238153800005-
dc.citation.woscount29-
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