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dc.contributor.authorLee, CYen_US
dc.contributor.authorLi, SYen_US
dc.contributor.authorLin, Pen_US
dc.contributor.authorTseng, TYen_US
dc.date.accessioned2014-12-08T15:16:39Z-
dc.date.available2014-12-08T15:16:39Z-
dc.date.issued2006-05-01en_US
dc.identifier.issn1536-125Xen_US
dc.identifier.urihttp://dx.doi.org/10.1109/TNANO.2006.874049en_US
dc.identifier.urihttp://hdl.handle.net/11536/12280-
dc.description.abstractA field-emission triode based on the low-temperature (75 degrees C) and hydrothermally synthesized single-crystalline zinc-oxide nanowires; (ZnO NWs) grown on Si substrate with a silicon dioxide (SiO2) insulator was fabricated for the controllable field-emission device application. Field-emission measurement reveals that the ZnO NWs fabricated on the Si substrate exhibit a good emission property with the turn-on electric field and threshold electric field (current density of 1 mA/cm(2)) of 1.6 and 2.1 V/mu m, respectively, with a field enhancement factor beta of 3340. The field-emission properties of the ZnO NW-based triode exhibit the controllable characteristics. The well-controlled field-emission characteristics can be divided into three parts: gate leakage region, linear region, and saturation region. Therefore, this study provides a low-temperature field-emission triode fabrication process that is compatible with the Si-based microelectronic integration, and the field-emission measurements also reveal that the emission behavior can be well controlled by adopting the triode structure.en_US
dc.language.isoen_USen_US
dc.subjectfield-emission triode and deviceen_US
dc.subjecthydrothermal methoden_US
dc.subjectnanowires (NWs)en_US
dc.subjectZnOen_US
dc.titleField-emission triode of low-temperature synthesized ZnO nanowiresen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TNANO.2006.874049en_US
dc.identifier.journalIEEE TRANSACTIONS ON NANOTECHNOLOGYen_US
dc.citation.volume5en_US
dc.citation.issue3en_US
dc.citation.spage216en_US
dc.citation.epage219en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000237822400013-
dc.citation.woscount21-
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