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dc.contributor.authorWang, Nanen_US
dc.contributor.authorKobayashi, Takayoshien_US
dc.date.accessioned2019-04-03T06:40:33Z-
dc.date.available2019-04-03T06:40:33Z-
dc.date.issued2014-11-17en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.22.028819en_US
dc.identifier.urihttp://hdl.handle.net/11536/123901-
dc.description.abstractSubtraction microscopy has recently been promoted for its compactness and simplicity of enhancing spatial resolution. However, until now, the subtraction factors used in such microscopes to process raw images have been chosen experientially, and it has been impossible to determine whether the resolved structures after subtraction are appropriate or over-processed. Based on vector diffraction theory and two-dimensional convolution, this paper presents numerical investigations of the parameters that may offer the selection criterion of subtraction factors used in subtraction microscopy. It proposes two essential parameters for appropriately evaluating the subtraction factor: the fluorescence peak intensity after subtraction and resolution derivative. (C) 2014 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleNumerical study of the subtraction threshold for fluorescence difference microscopyen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.22.028819en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume22en_US
dc.citation.issue23en_US
dc.citation.spage28819en_US
dc.citation.epage28830en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000345268500102en_US
dc.citation.woscount17en_US
Appears in Collections:Articles


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