標題: | Percolation conductivity in hafnium sub-oxides |
作者: | Islamov, D. R. Gritsenko, V. A. Cheng, C. H. Chin, A. 交大名義發表 National Chiao Tung University |
公開日期: | 29-Dec-2014 |
摘要: | In this study, we demonstrated experimentally that formation of chains and islands of oxygen vacancies in hafnium sub-oxides (HfOx, x < 2) leads to percolation charge transport in such dielectrics. Basing on the model of Efros-Shklovskii percolation theory, good quantitative agreement between the experimental and theoretical data of current-voltage characteristics was achieved. Based on the percolation theory suggested model shows that hafnium sub-oxides consist of mixtures of metallic Hf nanoscale clusters of 1-2 nm distributed onto non-stoichiometric HfOx. It was shown that reported approach might describe low resistance state current-voltage characteristics of resistive memory elements based on HfOx. (C) 2014 AIP Publishing LLC. |
URI: | http://dx.doi.org/10.1063/1.4905308 http://hdl.handle.net/11536/124065 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.4905308 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 105 |
Issue: | 26 |
Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.