標題: | Revealing the flexoelectricity in the mixed-phase regions of epitaxial BiFeO3 thin films |
作者: | Cheng, Cheng-En Liu, Heng-Jui Dinelli, Franco Chen, Yi-Chun Chang, Chen-Shiung Chien, Forest Shih-Sen Chu, Ying-Hao 材料科學與工程學系 光電工程學系 光電工程研究所 Department of Materials Science and Engineering Department of Photonics Institute of EO Enginerring |
公開日期: | 28-Jan-2015 |
摘要: | Understanding the elastic response on the nanoscale phase boundaries of multiferroics is an essential issue in order to explain their exotic behaviour. Mixed-phase BiFeO3 films, epitaxially grown on LaAlO3 (001) substrates, have been investigated by means of scanning probe microscopy to characterize the elastic and piezoelectric responses in the mixed-phase region of rhombohedral-like monoclinic (M-I) and tilted tetragonal-like monoclinic (M-II,M-tilt) phases. Ultrasonic force microscopy reveal that the regions with low/ high stiffness values topologically coincide with the M-I/M-II,M-tilt phases. X-ray diffraction strain analysis confirms that the M-I phase is more compliant than the M-II,(tilt) one. Significantly, the correlation between elastic modulation and piezoresponse across the mixed-phase regions manifests that the flexoelectric effect results in the enhancement of the piezoresponse at the phase boundaries and in the M-I regions. This accounts for the giant electromechanical effect in strained mixed-phase BiFeO3 films. |
URI: | http://dx.doi.org/10.1038/srep08091 http://hdl.handle.net/11536/124203 |
ISSN: | 2045-2322 |
DOI: | 10.1038/srep08091 |
期刊: | SCIENTIFIC REPORTS |
Volume: | 5 |
起始頁: | 0 |
結束頁: | 0 |
Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.