完整後設資料紀錄
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dc.contributor.authorChiang, Yu-Juen_US
dc.contributor.authorLi, Kuang-Chungen_US
dc.contributor.authorLin, Yi-Chiehen_US
dc.contributor.authorPan, Fu-Mingen_US
dc.date.accessioned2015-07-21T08:28:44Z-
dc.date.available2015-07-21T08:28:44Z-
dc.date.issued2015-01-01en_US
dc.identifier.issn1463-9076en_US
dc.identifier.urihttp://dx.doi.org/10.1039/c4cp04527ken_US
dc.identifier.urihttp://hdl.handle.net/11536/124233-
dc.description.abstractWe prepared PdO nanoflake thin films on the SiO2 substrate by reactive sputter deposition, and studied their sensing response to H-2 at temperatures between 25 and 250 degrees C. In addition to the oxygen ionosorption model, which is used to describe the early H-2 sensing response over the temperature range studied, the H-2 sensing kinetics of the PdO thin films can be separated into three temperature regimes: temperatures below 100 degrees C, around 150 degrees C and above 200 degrees C. At temperatures below 100 degrees C, PdO reduction is the dominant reaction affecting the H-2 sensing behavior. At temperatures around 150 degrees C, Pd reoxidation kinetically competes with PdO reduction leading to a complicated sensing characteristic. Active PdO reduction by H-2 promotes the continuing growth of Pd nanoislands, facilitating dissociative oxygen adsorption and thus the subsequent Pd reoxidation in the H-2-dry air gas mixture. The kinetic competition between the PdO reduction and reoxidation at 150 degrees C leads to the observation of an inverse of the increase in the sensor conductivity. At temperatures above 200 degrees C, the PdO sensor exhibits a sensor signal monotonically increasing with the H-2 concentration, and the H-2 sensing behavior is consistent with the Mars-van-Krevelen redox mechanism.en_US
dc.language.isoen_USen_US
dc.titleA mechanistic study of hydrogen gas sensing by PdO nanoflake thin films at temperatures below 250 degrees Cen_US
dc.typeArticleen_US
dc.identifier.doi10.1039/c4cp04527ken_US
dc.identifier.journalPHYSICAL CHEMISTRY CHEMICAL PHYSICSen_US
dc.citation.volume17en_US
dc.citation.spage3039en_US
dc.citation.epage3049en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000348203200015en_US
dc.citation.woscount0en_US
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