完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chiang, Yu-Ju | en_US |
dc.contributor.author | Li, Kuang-Chung | en_US |
dc.contributor.author | Lin, Yi-Chieh | en_US |
dc.contributor.author | Pan, Fu-Ming | en_US |
dc.date.accessioned | 2015-07-21T08:28:44Z | - |
dc.date.available | 2015-07-21T08:28:44Z | - |
dc.date.issued | 2015-01-01 | en_US |
dc.identifier.issn | 1463-9076 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1039/c4cp04527k | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/124233 | - |
dc.description.abstract | We prepared PdO nanoflake thin films on the SiO2 substrate by reactive sputter deposition, and studied their sensing response to H-2 at temperatures between 25 and 250 degrees C. In addition to the oxygen ionosorption model, which is used to describe the early H-2 sensing response over the temperature range studied, the H-2 sensing kinetics of the PdO thin films can be separated into three temperature regimes: temperatures below 100 degrees C, around 150 degrees C and above 200 degrees C. At temperatures below 100 degrees C, PdO reduction is the dominant reaction affecting the H-2 sensing behavior. At temperatures around 150 degrees C, Pd reoxidation kinetically competes with PdO reduction leading to a complicated sensing characteristic. Active PdO reduction by H-2 promotes the continuing growth of Pd nanoislands, facilitating dissociative oxygen adsorption and thus the subsequent Pd reoxidation in the H-2-dry air gas mixture. The kinetic competition between the PdO reduction and reoxidation at 150 degrees C leads to the observation of an inverse of the increase in the sensor conductivity. At temperatures above 200 degrees C, the PdO sensor exhibits a sensor signal monotonically increasing with the H-2 concentration, and the H-2 sensing behavior is consistent with the Mars-van-Krevelen redox mechanism. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A mechanistic study of hydrogen gas sensing by PdO nanoflake thin films at temperatures below 250 degrees C | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1039/c4cp04527k | en_US |
dc.identifier.journal | PHYSICAL CHEMISTRY CHEMICAL PHYSICS | en_US |
dc.citation.volume | 17 | en_US |
dc.citation.spage | 3039 | en_US |
dc.citation.epage | 3049 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000348203200015 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |