Pure electron-electron dephasing in percolative aluminum ultrathin film grown by molecular beam epitaxy

doi:10.1186/s11671-015-0782-x

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DC Field	Value	Language
dc.contributor.author	Lin, Shih-Wei	en_US
dc.contributor.author	Wu, Yue-Han	en_US
dc.contributor.author	Chang, Li	en_US
dc.contributor.author	Liang, Chi-Te	en_US
dc.contributor.author	Lin, Sheng-Di	en_US
dc.date.accessioned	2019-04-03T06:41:25Z	-
dc.date.available	2019-04-03T06:41:25Z	-
dc.date.issued	2015-02-18	en_US
dc.identifier.issn	1556-276X	en_US
dc.identifier.uri	http://dx.doi.org/10.1186/s11671-015-0782-x	en_US
dc.identifier.uri	http://hdl.handle.net/11536/124320	-
dc.description.abstract	We have successfully grown ultrathin continuous aluminum film by molecular beam epitaxy. This percolative aluminum film is single crystalline and strain free as characterized by transmission electron microscopy and atomic force microscopy. The weak anti-localization effect is observed in the temperature range of 1.4 to 10 K with this sample, and it reveals that, for the first time, the dephasing is purely caused by electron-electron inelastic scattering in aluminum.	en_US
dc.language.iso	en_US	en_US
dc.subject	Weak anti-localization	en_US
dc.subject	Ultrathin metal films	en_US
dc.subject	Pure electron-electron dephasing	en_US
dc.title	Pure electron-electron dephasing in percolative aluminum ultrathin film grown by molecular beam epitaxy	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1186/s11671-015-0782-x	en_US
dc.identifier.journal	NANOSCALE RESEARCH LETTERS	en_US
dc.citation.volume	10	en_US
dc.citation.spage	0	en_US
dc.citation.epage	0	en_US
dc.contributor.department	材料科學與工程學系	zh_TW
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Materials Science and Engineering	en_US
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000350566100001	en_US
dc.citation.woscount	3	en_US
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