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dc.contributor.authorChen, Jun-Rongen_US
dc.contributor.authorChang, Yi-Anen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorLu, Tien-Changen_US
dc.contributor.authorKuo, Yen-Kuangen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.date.accessioned2014-12-08T15:17:02Z-
dc.date.available2014-12-08T15:17:02Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-1173-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/12468-
dc.description.abstractVisible InGaP/InGaAlP resonant-cavity light-emitting diodes with low temperature sensitivity output characteristics were demonstrated. By means of extending the resonant cavity to a thickness of three wavelength (3 lambda), the degree of power variation between 25 and 95 degrees C for the devices biased at 20 mA was apparently reduced from -2.1 dB for the standard structure design (1-lambda cavity) to -0.6 dB. Numerical simulation showed that the insensitive temperature dependence of output characteristics was attributed to the reduced electron leakage current.en_US
dc.language.isoen_USen_US
dc.titleTheoretical and experimental analysis of temperature-insensitive 655-nm resonant-cavity LEDsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2007 PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1-4en_US
dc.citation.spage981en_US
dc.citation.epage982en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000256956600496-
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