Title: Fabrication and Characterization of Temperature Insensitive 660-nm Resonant-Cavity LEDs
Authors: Chen, Jun-Rong
Ko, Tsung-Shine
Lu, Tien-Chang
Chang, Yi-An
Kuo, Hao-Chung
Kuo, Yen-Kuang
Tsai, Jui-Yen
Laih, Li-Wen
Wang, Shing-Chung
光電工程學系
Department of Photonics
Keywords: Leakage current;modeling;polymethyl methacrylate plastic optic fiber (POF);resonant-cavity light-emitting diode (RCLED);semiconductor device
Issue Date: 1-Jul-2008
Abstract: InGaP/AIGaInP 660-nm resonant-cavity light-emitting diodes (RCLEDs) with stable temperature characteristics have been achieved by extending the resonant cavity length from one optical wavelength (1 lambda) to three optical wavelengths (3 lambda) and tripling the number of quantum wells. When the operation temperature increases from 25 degrees C to 95 degrees C, the degree of power variation at 20 mA is reduced from -2.1 dB to -0.6 dB for the conventional 1-lambda cavity RCLEDs and 3-lambda cavity RCLEDs, respectively. In order to interpret the temperature-dependent experimental results, advanced device simulation is applied to model the RCLEDs with different cavity designs. According to the numerical simulation results, we deduce that the stable temperature-dependent output performance should originate from the reduction of electron leakage current and thermally enhanced hole transport for the 3-lambda cavity AIGaInP RCLEDs.
URI: http://dx.doi.org/10.1109/JLT.2008.920639
http://hdl.handle.net/11536/8686
ISSN: 0733-8724
DOI: 10.1109/JLT.2008.920639
Journal: JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume: 26
Issue: 13-16
Begin Page: 1891
End Page: 1900
Appears in Collections:Articles


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