Polarization modulation for fluorescence emission difference microscopy

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DC 欄位	值	語言
dc.contributor.author	Wang, Nan	en_US
dc.contributor.author	Kobayashi, Takayoshi	en_US
dc.date.accessioned	2019-04-03T06:38:33Z	-
dc.date.available	2019-04-03T06:38:33Z	-
dc.date.issued	2015-05-18	en_US
dc.identifier.issn	1094-4087	en_US
dc.identifier.uri	http://dx.doi.org/10.1364/OE.23.013704	en_US
dc.identifier.uri	http://hdl.handle.net/11536/124808	-
dc.description.abstract	Effects of the polarization on subtracted images in fluorescence emission difference microscopy are numerically investigated based on vector beam diffraction theory and alteration of Jones matrices. Parameters of resolution, signal loss, and amplitude of negative sidebands after subtraction are discussed along with the polarization of excitation beams and sample sizes. The effects of polarization on the ellipticity and subtraction threshold are also given. (C) 2015 Optical Society of America	en_US
dc.language.iso	en_US	en_US
dc.title	Polarization modulation for fluorescence emission difference microscopy	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1364/OE.23.013704	en_US
dc.identifier.journal	OPTICS EXPRESS	en_US
dc.citation.volume	23	en_US
dc.citation.issue	10	en_US
dc.citation.spage	13704	en_US
dc.citation.epage	13712	en_US
dc.contributor.department	先進超快雷射研究中心	zh_TW
dc.contributor.department	Adv Ultrafast Laser Ctr	en_US
dc.identifier.wosnumber	WOS:000354706800117	en_US
dc.citation.woscount	6	en_US
顯示於類別：	期刊論文

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