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dc.contributor.authorLiu, Yao-Chiaen_US
dc.contributor.authorChen, Wei-Zenen_US
dc.contributor.authorChou, Mao-Hsuanen_US
dc.contributor.authorTsai, Tsung-Hsienen_US
dc.contributor.authorLee, Yen-Weien_US
dc.contributor.authorYuan, Min-Shuehen_US
dc.date.accessioned2015-07-21T08:30:59Z-
dc.date.available2015-07-21T08:30:59Z-
dc.date.issued2013-01-01en_US
dc.identifier.isbn978-1-4673-6146-0en_US
dc.identifier.issnen_US
dc.identifier.urihttp://hdl.handle.net/11536/125071-
dc.description.abstractA 0.1-3 GHz, cell-based, fractional-N ADPLL with Delta Sigma noise-shaped phase detector is presented. By dithering the reference phase and quantization phase error through an additional feedback path, linear phase detection and zero stabilization are accomplished without resort to sophisticated time to digital converter (TDC). The measured rms jitter from a 3GHz carrier is 1.9 ps with a multiplication factor of 60. Implemented in TSMC 40nm general purpose superb CMOS technology, the chip size is 280um x 240um.en_US
dc.language.isoen_USen_US
dc.subjectTDCen_US
dc.subjectDelta Sigma phase detectoren_US
dc.subjectfractional-N ADPLLen_US
dc.titleA 0.1-3GHz Cell-Based Fractional-N All Digital Phase-Locked Loop Using Delta Sigma Noise-Shaped Phase Detectoren_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000350887800127en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper