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標題: 攔檢高解析度和高開口率面板TN製程之點缺陷
Point.Detect Inspections of High.Resolution and High.Aperture.Ratio TFT TN LCD Panels
作者: 楊敏智
Yang,Min-Chih
楊界雄
Yang,Kei-Hsiung
光電科技學程
關鍵字: 高解析度;高開口率;面板測試;點缺陷;類列反轉驅動;High.resolution;High.aperture.ratio;Cell lighting;Shorting bar;point defect;quasi-column
公開日期: 2015
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT070258303
http://hdl.handle.net/11536/127103
Appears in Collections:Thesis


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