| 標題: | 攔檢高解析度和高開口率面板TN製程之點缺陷 Point.Detect Inspections of High.Resolution and High.Aperture.Ratio TFT TN LCD Panels |
| 作者: | 楊敏智 Yang,Min-Chih 楊界雄 Yang,Kei-Hsiung 光電科技學程 |
| 關鍵字: | 高解析度;高開口率;面板測試;點缺陷;類列反轉驅動;High.resolution;High.aperture.ratio;Cell lighting;Shorting bar;point defect;quasi-column |
| 公開日期: | 2015 |
| URI: | http://140.113.39.130/cdrfb3/record/nctu/#GT070258303 http://hdl.handle.net/11536/127103 |
| 顯示於類別： | 畢業論文 |
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