應用於深次20奈米快閃記憶體之錯誤處理方法

Full metadata record

DC Field	Value	Language
dc.contributor.author	林緯	en_US
dc.contributor.author	Lin Wei	en_US
dc.contributor.author	張俊彥	en_US
dc.contributor.author	Chang,Chun-Yen	en_US
dc.date.accessioned	2015-11-26T01:02:20Z	-
dc.date.available	2015-11-26T01:02:20Z	-
dc.date.issued	2015	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#GT079811562	en_US
dc.identifier.uri	http://hdl.handle.net/11536/127333	-
dc.language.iso	en_US	en_US
dc.subject	快閃記憶體	zh_TW
dc.subject	數位訊號處理	zh_TW
dc.subject	錯誤更正碼	zh_TW
dc.subject	NAND Flash Memory	en_US
dc.subject	DSP	en_US
dc.subject	ECC	en_US
dc.title	應用於深次20奈米快閃記憶體之錯誤處理方法	zh_TW
dc.title	Advance Error Handling for Deep Sub-20nm NAND Flash Memory	en_US
dc.type	Thesis	en_US
dc.contributor.department	電子工程學系電子研究所	zh_TW
Appears in Collections:	Thesis