完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 黃智宏 | en_US |
dc.contributor.author | Huang, Zhi-Hong | en_US |
dc.contributor.author | 莊紹勳 | en_US |
dc.contributor.author | Chung, Shao-Shiun | en_US |
dc.date.accessioned | 2015-11-26T01:02:27Z | - |
dc.date.available | 2015-11-26T01:02:27Z | - |
dc.date.issued | 2015 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT070250150 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/127427 | - |
dc.language.iso | en_US | en_US |
dc.subject | 單次寫入唯讀記憶體 | zh_TW |
dc.subject | 互補式電晶體 | zh_TW |
dc.subject | 熔斷 | zh_TW |
dc.subject | 介電層崩潰 | zh_TW |
dc.subject | 隨機電報雜訊 | zh_TW |
dc.subject | 可靠度 | zh_TW |
dc.subject | OTP | en_US |
dc.subject | CMOS | en_US |
dc.subject | fuse | en_US |
dc.subject | dielectric breakdown | en_US |
dc.subject | RTN | en_US |
dc.subject | Reliability | en_US |
dc.title | 運用介電層熔斷崩潰機制設計新穎的單次寫入唯讀記憶體 | zh_TW |
dc.title | A One-Time-Programmable Array Based on a New Dielectric Fuse Breakdown Mechanism | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 電子工程學系 電子研究所 | zh_TW |
顯示於類別: | 畢業論文 |