標題: Tapered Cu pattern metallization by electrodeposition through mask
作者: Jenq, Shrane Ning
Wan, Chi Chao
Wang, Yung Yun
Li, Hung Wei
Liu, Po Tsun
Chen, Jing Hon
顯示科技研究所
Institute of Display
公開日期: 2006
摘要: A tapered shape of Cu pattern by electrodeposition through mask is preferred for fabricating metal line on thin-film transistors (TFTs). The influence of individual organic additive [polyethylene glycol (PEG), bis-3-sodiumsulfopropyl disulfide (SPS)] on the sidewall shape of the Cu pattern was identified. A compromising effect shows up when both PEG and SPS are added owing to the competition of the behavior of two different organic additives during Cu electrodeposition. Therefore, a method has been developed for the fabrication of copper pattern used in TFTs, which forms a tapered pattern in one single Cu deposition step. (c) 2006 The Electrochemical Society.
URI: http://hdl.handle.net/11536/12752
http://dx.doi.org/10.1149/1.2236375
ISSN: 1099-0062
DOI: 10.1149/1.2236375
期刊: ELECTROCHEMICAL AND SOLID STATE LETTERS
Volume: 9
Issue: 10
起始頁: C167
結束頁: C170
顯示於類別:期刊論文