標題: | Tapered Cu pattern metallization by electrodeposition through mask |
作者: | Jenq, Shrane Ning Wan, Chi Chao Wang, Yung Yun Li, Hung Wei Liu, Po Tsun Chen, Jing Hon 顯示科技研究所 Institute of Display |
公開日期: | 2006 |
摘要: | A tapered shape of Cu pattern by electrodeposition through mask is preferred for fabricating metal line on thin-film transistors (TFTs). The influence of individual organic additive [polyethylene glycol (PEG), bis-3-sodiumsulfopropyl disulfide (SPS)] on the sidewall shape of the Cu pattern was identified. A compromising effect shows up when both PEG and SPS are added owing to the competition of the behavior of two different organic additives during Cu electrodeposition. Therefore, a method has been developed for the fabrication of copper pattern used in TFTs, which forms a tapered pattern in one single Cu deposition step. (c) 2006 The Electrochemical Society. |
URI: | http://hdl.handle.net/11536/12752 http://dx.doi.org/10.1149/1.2236375 |
ISSN: | 1099-0062 |
DOI: | 10.1149/1.2236375 |
期刊: | ELECTROCHEMICAL AND SOLID STATE LETTERS |
Volume: | 9 |
Issue: | 10 |
起始頁: | C167 |
結束頁: | C170 |
Appears in Collections: | Articles |