標題: | Constant Excess Bias Control for Single-Photon Avalanche Diode Using Real-Time Breakdown Monitoring |
作者: | Chang, Po-Hsuan Tsai, Chia-Ming Wu, Jau-Yang Lin, Sheng-Di Kuo, Ming-Ching 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Single-photon;avalanche;diode;single-photon avalanche diode;breakdown |
公開日期: | 1-Aug-2015 |
摘要: | A monolithic constant excess bias control circuit for single-photon avalanche diode (SPAD) in standard 0.18-mu m CMOS technology is reported. The proposed real-time breakdown monitoring technique is incorporated into a passive-quenching-active-reset circuit. A sample-and-hold circuit samples the breakdown level of SPAD through well-defined sampling phase. Following the sample-and-hold circuit, the level shifter with voltage shifting defined by predetermined excess bias provides the reset voltage of SPAD. The design operates the SPAD under constant excess bias and effectively mitigates the impact of the process-voltage-temperature variation by maintaining the optimal excess bias condition. |
URI: | http://dx.doi.org/10.1109/LED.2015.2450936 http://hdl.handle.net/11536/128005 |
ISSN: | 0741-3106 |
DOI: | 10.1109/LED.2015.2450936 |
期刊: | IEEE ELECTRON DEVICE LETTERS |
Volume: | 36 |
起始頁: | 859 |
結束頁: | 861 |
Appears in Collections: | Articles |