標題: A Fast Prototyping Framework for Analog Layout Migration With Planar Preservation
作者: Pan, Po-Cheng
Chin, Ching-Yu
Chen, Hung-Ming
Chen, Tung-Chieh
Lee, Chin-Chieh
Lin, Jou-Chun
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: AMS circuit design;layout migration;low dropout (LDO) regulator;placement and routing;prototyping;slicing tree;triangulation
公開日期: 1-九月-2015
摘要: Analog layout generation in the advanced CMOS design is challenging by its increasing layout constraints and performance requirements. This situation becomes more intricate by the growing parasitic variability and manufacturing reliability. To facilitate the feasibility of template-based layout migration, this paper first introduces a layout preservation, which extracts placement and routing behaviors from an existing layout into a crossing graph via constrained Delaunay triangulation. And later this crossing graph can be migrated into multiple layouts with placement and routing reconnection. The proposed approach also provides a refinement for wire to optimize the performance metrics. This approach is applied to a variable-gain amplifier, a folded-cascode operational amplifier, and a low dropout regulator. The experimental results demonstrate more possibility on layout migration, such that averagely more than 75% routing of migrated layout is generated by our approach. Additionally, it exhibits the productivity with qualified performance on different designs.
URI: http://dx.doi.org/10.1109/TCAD.2015.2418312
http://hdl.handle.net/11536/128139
ISSN: 0278-0070
DOI: 10.1109/TCAD.2015.2418312
期刊: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Volume: 34
起始頁: 1373
結束頁: 1386
顯示於類別:期刊論文