標題: | Method to evaluate afterpulsing probability in single-photon avalanche diodes |
作者: | Tzou, Bo-Wei Wu, Jau-Yang Lee, Yi-Shan Lin, Sheng-Di 電機工程學系 Department of Electrical and Computer Engineering |
公開日期: | 15-八月-2015 |
摘要: | We propose and demonstrate a new method for evaluating the afterpulsing effect in single-photon avalanche photodiodes (SPADs). By analyzing the statistical property of dark count rate, we can quantitatively characterize afterpulsing probability (APP) of a SPAD. In experiment, the temperature-dependent low dark count rate (DCR) distribution becomes non-Poissonian at lower temperature and has higher excess bias as the afterpulsing effect becomes significant. Our work provides a flexible way to examine APP in either single-device or circuit level. (C) 2015 Optical Society of America |
URI: | http://dx.doi.org/10.1364/OL.40.003774 http://hdl.handle.net/11536/128152 |
ISSN: | 0146-9592 |
DOI: | 10.1364/OL.40.003774 |
期刊: | OPTICS LETTERS |
Volume: | 40 |
Issue: | 16 |
起始頁: | 3774 |
結束頁: | 3777 |
顯示於類別: | 期刊論文 |