標題: Method to evaluate afterpulsing probability in single-photon avalanche diodes
作者: Tzou, Bo-Wei
Wu, Jau-Yang
Lee, Yi-Shan
Lin, Sheng-Di
電機工程學系
Department of Electrical and Computer Engineering
公開日期: 15-Aug-2015
摘要: We propose and demonstrate a new method for evaluating the afterpulsing effect in single-photon avalanche photodiodes (SPADs). By analyzing the statistical property of dark count rate, we can quantitatively characterize afterpulsing probability (APP) of a SPAD. In experiment, the temperature-dependent low dark count rate (DCR) distribution becomes non-Poissonian at lower temperature and has higher excess bias as the afterpulsing effect becomes significant. Our work provides a flexible way to examine APP in either single-device or circuit level. (C) 2015 Optical Society of America
URI: http://dx.doi.org/10.1364/OL.40.003774
http://hdl.handle.net/11536/128152
ISSN: 0146-9592
DOI: 10.1364/OL.40.003774
期刊: OPTICS LETTERS
Volume: 40
Issue: 16
起始頁: 3774
結束頁: 3777
Appears in Collections:Articles