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dc.contributor.authorChou, Hsuan-Mingen_US
dc.contributor.authorHsiao, Ming-Yien_US
dc.contributor.authorChen, Yi-Chiaoen_US
dc.contributor.authorYang, Keng-Haoen_US
dc.contributor.authorTsao, Jeanen_US
dc.contributor.authorLung, Chiao-Lingen_US
dc.contributor.authorChang, Shih-Chiehen_US
dc.contributor.authorJone, Wen-Benen_US
dc.contributor.authorChen, Tien-Fuen_US
dc.date.accessioned2015-12-02T02:59:41Z-
dc.date.available2015-12-02T02:59:41Z-
dc.date.issued2015-09-01en_US
dc.identifier.issn1063-8210en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TVLSI.2014.2348872en_US
dc.identifier.urihttp://hdl.handle.net/11536/128437-
dc.description.abstractSoft error has become an important reliability issue in advanced technologies. To tolerate soft errors, solutions suggested in previous works incur significant performance and power penalties, especially when a design with fault-tolerant structures is overprotected. In this paper, we present a soft-error-tolerant design methodology to tradeoff performance, power, and reliability for different applications. First, four novel detection and correction flip-flop (FF) structures are proposed to provide different levels of tolerance capability against soft errors. Second, architecture-level vulnerability and logic-level susceptibility analyses are employed to identify weak FFs that can easily cause program execution errors. Third, an optimization framework is developed to synthesize the proposed four novel FF structures into weak and highly observable storage bits with the flexibility of trading off performance, power, and reliability. A five-stage pipeline RISC core (UniRISC) is adopted to demonstrate the usefulness of our methodology. Experimental results show that the proposed method can accomplish design goals by balancing performance, power, and reliability. For example, we can not only satisfy the reliability requirement that no more than five errors occur per one billion hours in a design but also reduce up to 87% performance overhead and 91% power overhead when compared with previous works.en_US
dc.language.isoen_USen_US
dc.subjectPower consumptionen_US
dc.subjectreliabilityen_US
dc.subjectsoft erroren_US
dc.subjectsusceptibilityen_US
dc.subjectvulnerabilityen_US
dc.titleSoft-Error-Tolerant Design Methodology for Balancing Performance, Power, and Reliabilityen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TVLSI.2014.2348872en_US
dc.identifier.journalIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSen_US
dc.citation.volume23en_US
dc.citation.spage1628en_US
dc.citation.epage1639en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000364208100005en_US
dc.citation.woscount0en_US
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