標題: Convenient Ratio Approach for Industrial Implementation in Estimating and Testing Process Yield
作者: Pearn, W. L.
Tai, Y. T.
Kao, C. M.
統計學研究所
工業工程與管理學系
Institute of Statistics
Department of Industrial Engineering and Management
關鍵字: process yield;ratio approach;lower confidence bound;critical value
公開日期: 1-Jul-2015
摘要: In recent years, since portable devices with thin and light designs are essential, the applications of the thin-film transistor liquid crystal display (TFT-LCD) have been applied extensively. Process yield is the most common criterion used in the TFT-LCD manufacturing industry for measuring process performance. The measurement index Spk establishes the relationship between the manufacturing specifications and the actual process performance, which provides an exact measure on process yield. In this paper, we provide two convenient ratio approaches to calculate the lower confidence bounds and critical values extensively for various values of alpha-risk, capability requirements, and sample sizes. Practitioners can use the proposed ratio approaches and procedures to determine whether their process meets the preset capability requirement and make reliable decisions. The convenient ratio approaches can bridge the gap between the theoretical development and factory applications for evaluation of process yields.
URI: http://dx.doi.org/10.1520/JTE20140012
http://hdl.handle.net/11536/128446
ISSN: 0090-3973
DOI: 10.1520/JTE20140012
期刊: JOURNAL OF TESTING AND EVALUATION
Volume: 43
起始頁: 917
結束頁: 923
Appears in Collections:Articles