標題: | First-principles Calculations on the Schottky Barrier Height of the NiGe/n-type Ge Contact with Dopant Segregation |
作者: | Lin, Han-Chi Lin, Chiung-Yuan Shih, Che-Ju Tsui, Bing-Yue 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-一月-2014 |
摘要: | Effects of dopant segregation at the NiGe/Ge interface are analyzed theoretically and experimentally. First-principles calculations indicate that the physical Schottky barrier height would be reduced by the segregation of As by 0.081 eV. This small value is due to the Fermi-level pinning effect. Further improvement of the contact resistance may be achieved by reducing the interface states. |
URI: | http://hdl.handle.net/11536/128522 |
ISBN: | 978-1-4799-4780-5 |
ISSN: | 2378-8593 |
期刊: | 2014 INTERNATIONAL SYMPOSIUM ON NEXT-GENERATION ELECTRONICS (ISNE) |
顯示於類別: | 會議論文 |